• DocumentCode
    2519468
  • Title

    Nanostructured materials for sensing and imaging

  • Author

    Zhang, D.H. ; Yan, C.C. ; Chen, X.Z. ; Jin, Y.J. ; Li, D.D. ; Bian, H.J. ; Xu, Z.J. ; Wang, Y.K.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • fDate
    3-6 Dec. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    From semiconductor quantum well structures to the currently hottest metamaterials, the conquest of nano-world has been occurring in almost every field of research. In the field of quantum well structures for infrared photodetection, the inclusion of dilute nitride layers in the mature GaAs based quantum well structures results in a TE dominate photocurrent and the incorporation of nitrogen in the narrow bandgap InSb materials makes it possible for wide band infrared absorption covering mid and long wavelength infrared range. With the nanostructured materials made of metal and dielectric composites, visible light can be manipulated, which has potential application for super resolution imaging beyond diffraction limit.
  • Keywords
    III-V semiconductors; arsenic compounds; dielectric materials; energy gap; gallium arsenide; indium compounds; infrared detectors; infrared imaging; infrared spectra; metamaterials; nanocomposites; nanophotonics; nanosensors; nanostructured materials; optical materials; optical sensors; photodetectors; semiconductor quantum wells; silicon; GaAs:Si-GaAs-In0.3Ga0.7As0.93N0.01-Si-GaAs-GaAs:Si-GaAs; dielectric composites; imaging; infrared photodetection; metal composites; metamaterials; nanostructured materials; photocurrent; semiconductor quantum well structures; sensing; super resolution imaging; wide band infrared absorption; Absorption; Gallium arsenide; Metamaterials; Nitrogen; Photoconductivity; Silver; imaging; infrared photodetector; nanostructure; sensing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
  • Conference_Location
    Guangzhou
  • Print_ISBN
    978-1-4244-8393-8
  • Electronic_ISBN
    978-1-4244-8392-1
  • Type

    conf

  • DOI
    10.1109/AOM.2010.5713576
  • Filename
    5713576