Title :
Test buffer with extended common mode input voltage
Author :
Nicolae, Cojan ; Arcadie, Cracan ; Radu, Cojan
Author_Institution :
Fac. of Electron., Telecommun. & Technol. Inf., Gh. Asachi Univ., Iasi, Romania
Abstract :
The paper presents an adequate buffer for testing integrated circuits. The buffer operation is based on changing the DC level of the incoming signal to a reference common mode voltage VREF with an error of 0.003% for a large domain of common mode input voltages. The proposed circuit uses a negative feedback loop to achieve unity gain by transconductance control.
Keywords :
buffer circuits; feedback; integrated circuit testing; DC level; buffer operation; buffer testing; extended common mode input voltage; integrated circuit testing; negative feedback loop; transconductance control; Automatic testing; Circuit testing; Electronic equipment testing; Feedback circuits; Integrated circuit technology; Integrated circuit testing; Negative feedback loops; Semiconductor device measurement; Signal design; Voltage;
Conference_Titel :
MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
Conference_Location :
Valletta
Print_ISBN :
978-1-4244-5793-9
DOI :
10.1109/MELCON.2010.5476002
