• DocumentCode
    2519550
  • Title

    Future Lead-Free Solder Alloys and Fluxes - Meeting Challenges of Miniaturization

  • Author

    Lee, Ning-Cheng

  • Author_Institution
    Indium Corp. of America, Clinton, NY, USA
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    864
  • Lastpage
    872
  • Abstract
    Miniaturization and green manufacturing are the electronics industry´s leading trends. New Pb-Free solder alloys must have special characteristics, such as reduced melting temperatures and wetting speeds, while increasing solder spread. These alloys should display finer grain structure, reduced voiding tendencies, and low IMC platelets formation, yet have high corrosion, electrochemical migration and oxidation resistances. The nature of future no-clean fluxes must also be taken into consideration, complementing these greener alloys by being probe-testable, halogen-free, with greater fluxing action, lower activation temperature and reduced spattering. The key is charring resistance and the oxidation barrier, which protects the alloy from surface oxidation.
  • Keywords
    corrosion resistance; electromigration; oxidation; solders; IMC platelets; Lead-Free Solder Alloys; activation temperature; charring resistance; corrosion resistance; electrochemical migration resistance; fluxing action; melting temperatures; miniaturization; oxidation barrier; oxidation resistance; surface oxidation; wetting; Conducting materials; Costs; Electronics industry; Environmentally friendly manufacturing techniques; Lead; Oxidation; Samarium; Soldering; Surface resistance; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763539
  • Filename
    4763539