DocumentCode :
2519550
Title :
Future Lead-Free Solder Alloys and Fluxes - Meeting Challenges of Miniaturization
Author :
Lee, Ning-Cheng
Author_Institution :
Indium Corp. of America, Clinton, NY, USA
fYear :
2008
fDate :
9-12 Dec. 2008
Firstpage :
864
Lastpage :
872
Abstract :
Miniaturization and green manufacturing are the electronics industry´s leading trends. New Pb-Free solder alloys must have special characteristics, such as reduced melting temperatures and wetting speeds, while increasing solder spread. These alloys should display finer grain structure, reduced voiding tendencies, and low IMC platelets formation, yet have high corrosion, electrochemical migration and oxidation resistances. The nature of future no-clean fluxes must also be taken into consideration, complementing these greener alloys by being probe-testable, halogen-free, with greater fluxing action, lower activation temperature and reduced spattering. The key is charring resistance and the oxidation barrier, which protects the alloy from surface oxidation.
Keywords :
corrosion resistance; electromigration; oxidation; solders; IMC platelets; Lead-Free Solder Alloys; activation temperature; charring resistance; corrosion resistance; electrochemical migration resistance; fluxing action; melting temperatures; miniaturization; oxidation barrier; oxidation resistance; surface oxidation; wetting; Conducting materials; Costs; Electronics industry; Environmentally friendly manufacturing techniques; Lead; Oxidation; Samarium; Soldering; Surface resistance; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
Type :
conf
DOI :
10.1109/EPTC.2008.4763539
Filename :
4763539
Link To Document :
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