• DocumentCode
    2519552
  • Title

    Tunable CMOS resistor circuit with improved linearity based on the arithmetical mean computation

  • Author

    Popa, Cosmin

  • Author_Institution
    Fac. of Electron., Telecommun. & Inf. Technol., Univ. Politeh. of Bucharest, Bucharest, Romania
  • fYear
    2010
  • fDate
    26-28 April 2010
  • Firstpage
    1379
  • Lastpage
    1382
  • Abstract
    An original active resistor structure using exclusively MOS devices working in the saturation region will be further presented. Performing the great advantage of an excellent linearity, obtained by a proper biasing of the differential core (using original translation and arithmetical mean blocks), the proposed circuit is designed for low-voltage low-power operation and allows a very good controllability of the equivalent resistance. The estimated linearity is obtained for an extended range of the differential input voltage and in the worst case of considering second-order effects that affect MOS transistors operation. The frequency response of the new active resistor is strongly increased by operating all MOS devices in the saturation region. The circuit is implemented in 0.35 μm CMOS technology on a die area of 30 μm × 40 μm, being supplied at ± 3.6 V . The active resistor presents a very good linearity (THD <; 0.8%) for an extended range of the input voltage ( - 2.5 V <; VX - VY <; 2.5 V). The tuning range is extremely large comparing with the previous reported active resistors: ± (500 kO - 5 MΩ) , the circuit being able to simulate both positive and negative active resistances.
  • Keywords
    CMOS integrated circuits; MIS devices; circuit tuning; low-power electronics; resistors; MOS device; active resistor structure; arithmetical mean computation; low-voltage low-power operation; tunable CMOS resistor circuit; tuning range; CMOS technology; Circuit optimization; Controllability; Frequency response; Linearity; MOS devices; MOSFETs; Resistors; Tunable circuits and devices; Voltage; Linearity; differential amplifier; equivalent active resistance; second-order effects;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference
  • Conference_Location
    Valletta
  • Print_ISBN
    978-1-4244-5793-9
  • Type

    conf

  • DOI
    10.1109/MELCON.2010.5476005
  • Filename
    5476005