DocumentCode
2519573
Title
Nonlinear disturbance errors in system identification using multisine test signals
Author
Evans, Ceri ; Rees, David ; Jones, Lee
Author_Institution
Dept. of Electron. & IT, Glamorgan Univ., UK
fYear
1993
fDate
18-20 May 1993
Firstpage
258
Lastpage
263
Abstract
The errors introduced into linear system identification by nonlinear distortions are examined. A theoretical framework is presented for the distortion generated by odd power nonlinearities when using multisine test signals for frequency domain identification. It is shown that the distortion is a function of the number of test harmonics, their harmonic values and their phases. An explanation of previously published practical results is then given. This leads to the definition of a novel class of signals, termed no interharmonic distortion (NID) multisines, with interesting properties. The application of NID multisines to system testing with a recently proposed method of compensating for nonlinearities is examined. This allows the identification of the linear system and the straightforward calculation of the coefficient of the nonlinear term
Keywords
electric distortion; error analysis; error compensation; frequency-domain analysis; harmonic analysis; identification; linear systems; measurement errors; measurement theory; signal processing; testing; compensation; frequency domain identification; harmonic values; interharmonic distortion; linear system identification; multisine test signals; nonlinear distortions; odd power nonlinearities; system testing; test harmonics; Frequency domain analysis; Harmonic distortion; Linear systems; Nonlinear distortion; Phase distortion; Power generation; Signal generators; Signal processing; System identification; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location
Irvine, CA
Print_ISBN
0-7803-1229-5
Type
conf
DOI
10.1109/IMTC.1993.382639
Filename
382639
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