DocumentCode :
2519622
Title :
Fundamental characterization studies of GaSb solar cells
Author :
Fraas, L.M. ; Avery, J.E. ; Gruenbaum, P.E. ; Sundaram, V.S. ; Emery, K. ; Matson, R.
Author_Institution :
Boeing High Technol. Center, Seattle, WA, USA
fYear :
1991
fDate :
7-11 Oct 1991
Firstpage :
80
Abstract :
Measured forward and reverse current versus voltage curves for GaSb cells at various temperatures and for different substrate dopant densities are modeled. The authors show that tunneling across a lower bandgap for reverse-biased GaSb cells allows nondestructive reverse current flow at low voltages. Thus, the GaSb IR cell doubles as a bypass diode, providing shading protection for the GaAs cell. Measured GaSb quantum yield curves are also modeled, and the resultant minority carrier diffusion lengths are compared with electron beam induced current measurements. It is found that the GaSb cell properties are consistent with predictions based on a direct gap single-crystal material
Keywords :
III-V semiconductors; carrier lifetime; electric current measurement; gallium compounds; minority carriers; solar cells; GaAs cell; GaSb; bypass diode; direct gap single-crystal material; electron beam induced current measurements; forward current; lower bandgap; minority carrier diffusion lengths; nondestructive reverse current flow; quantum yield curves; reverse current; reverse-biased GaSb cells; shading protection; solar cells; substrate dopant densities; tunneling; voltage curves; Current measurement; Density measurement; Diodes; Low voltage; Photonic band gap; Photovoltaic cells; Protection; Semiconductor process modeling; Temperature; Tunneling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1991., Conference Record of the Twenty Second IEEE
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-87942-636-5
Type :
conf
DOI :
10.1109/PVSC.1991.169186
Filename :
169186
Link To Document :
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