DocumentCode :
2519713
Title :
NON-INVASIVE IMAGE BASED SUPPORT VECTOR MACHINE CLASSIFICATION OF HUMAN EMBRYONIC STEM CELLS
Author :
Mangoubi, Rami ; Jeffreys, Christopher ; Copeland, Andrew ; Desai, Mukund ; Sammak, Paul
Author_Institution :
C.S. Draper Lab. Cambridge, MA
fYear :
2007
fDate :
12-15 April 2007
Firstpage :
284
Lastpage :
287
Abstract :
We present a non-invasive, non-destructive automatable image-based methodology for classifying human embryonic stem cell (hESC) colonies. In contrast to differentiated colonies, pluripotent colonies contain homogeneous tight textures, thus allowing a statistical analysis of the coefficients obtained from a wavelet based texture decomposition to discriminate between the colonies. Similarly, borders of undifferentiated cell colonies are sharp, and circular, while those of differentiated colonies are not. We confine our description in this paper to texture analysis, which relies on a parametric and non-parametric hierarchical statistical classification. Parametric classification relies on probability models for texture wavelet coefficients, while non-parametric classification makes use of support vector machines. Preliminary implementation using a truth set yielded a 96% rate of successful colony classification between distant classes, while for intermediate classes of colonies, with mixed population, the success rate was at least 86%. The texture analysis was also validated using individual egg cell images
Keywords :
cellular biophysics; image classification; medical image processing; support vector machines; wavelet transforms; colony classification; human embryonic stem cells; image classification; support vector machine; texture decomposition; texture wavelet coefficients; Embryo; Humans; Image analysis; Probability; Statistical analysis; Stem cells; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet coefficients;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Biomedical Imaging: From Nano to Macro, 2007. ISBI 2007. 4th IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
1-4244-0672-2
Electronic_ISBN :
1-4244-0672-2
Type :
conf
DOI :
10.1109/ISBI.2007.356844
Filename :
4193278
Link To Document :
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