Title :
Compensation of hysteresis for calibrator of giant magnetostrictive actuator based on preisach model
Author :
Lei, Wang ; Fen, Song Jian
Author_Institution :
Harbin Inst. of Technol., Harbin, China
Abstract :
A calibrator based on the giant magnetostrictive actuator is most suitable to calibrate accuracy and frequency response of high-precision displacement sensor, because giant magnetostrictive actuator has some unique characteristics, such as big output force, high precision micro-displacement whose accuracy can be in nm and high frequency response. But the relation between input magnetic field and output micro-displacement of giant magnetostrictive actuator because of hysteresis will be nonlinearity, special in high frequency response. The classical Preisach model had been used to approximate the hysteresis of the giant magnetostrictive actuator in this paper. And we have applied the inverse preisach operator to compensate hysteresis of actuator in a feedback control loop for improving the output characteristic of giant magnetostrictive actuator. Through emulating, it had been verified that the effect of hysteresis had been attenuated obviously. Through calibrating a high-precision sensor, we could verify that the giant magnetostrictive actuator have higher precise position in high frequency response after compensating hysteresis.
Keywords :
calibration; compensation; electromagnetic actuators; feedback; frequency response; inductive sensors; magnetic hysteresis; magnetic variables control; magnetostrictive devices; microactuators; transducers; calibrator; feedback control loop; frequency response; giant magnetostrictive microdisplacement actuator; high precision microdisplacement; high-precision displacement sensor; high-precision inductive transducer; high-precision sensor; hysteresis compensation; output force; preisach model; Actuators; Frequency response; Magnetic domains; Magnetic hysteresis; Magnetostriction; Saturation magnetization; Giant magnetostriction; actuator; calibrator; hysteresis; surface profile;
Conference_Titel :
Advances in Optoelectronics and Micro/Nano-Optics (AOM), 2010 OSA-IEEE-COS
Conference_Location :
Guangzhou
Print_ISBN :
978-1-4244-8393-8
Electronic_ISBN :
978-1-4244-8392-1
DOI :
10.1109/AOM.2010.5713592