Title :
Thermal, Mechanical and Optical Analysis of SiC-based LED
Author :
Rong-feng, Guan ; Da-lei, Tian ; Xing, Wang ; Wen-qing, Zhao
Author_Institution :
Inst. of Mater. Sci. & Eng., Henan Polytech. Univ., Jiaozuo, China
Abstract :
Reliability is one of the important problems in electronic packaging, which affects the use and life of the products. In this paper, we present a high power SiC-based light-emitting diode (LED), the thermal, mechanical and optical performances were investigated respectively. Heat dissipation performance and junction temperature were obtained using finite element analysis (FEA), the influences were analyzed on the temperature of the chip with different power input and convection coefficient, mechanical characteristics were researched by its thermal stress; optical properties were simulated using optical analysis software and experiment. The results show that the maximal temperature which appears in the chip is about 93°C; the thermal resistance in the package is found to be 8.73°C /W; great thermal stress lies between chip and silver epoxy, which will depress the reliability of the LED, its optical properties can be improved by second optical design. The luminous flux, efficacy and color coordinates will change with the increase of current.
Keywords :
finite element analysis; light emitting diodes; silicon compounds; thermal resistance; thermal stresses; wide band gap semiconductors; LED; SiC; color coordinates; convection coefficient; efficacy; finite element analysis; heat dissipation; high power light-emitting diode; luminous flux; optical analysis; optical properties; power input; reliability; thermal resistance; thermal stress; Analytical models; Electronic packaging thermal management; Electronics packaging; Finite element methods; Light emitting diodes; Mechanical factors; Performance analysis; Temperature; Thermal resistance; Thermal stresses;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763550