• DocumentCode
    2519762
  • Title

    A utility maximization approach to the design of unequal error protection with multilevel codes

  • Author

    Shen, Cong ; Fitz, Michael P.

  • Author_Institution
    Electr. Eng. Dept., Univ. of California, Los Angeles, CA
  • fYear
    2008
  • fDate
    6-11 July 2008
  • Firstpage
    2031
  • Lastpage
    2035
  • Abstract
    The observation that different bit positions in a constellation typically have different error protection capabilities is utilized to design unequal error protection (UEP) with multilevel coding (MLC) in AWGN and fading channels. Both parallel independent decoding (PID) and multi-stage decoding (MSD) are considered. The design tool in this work is the symmetric information rate (SIR), which is well suited to the use of capacity-approaching component codes. This paper first formulates the UEP design as a utility maximization problem, and then considers some optimal UEP designs, including mapping, non-uniform constellation, bits grouping, and decoding order in MSD. Several exemplary utility functions are studied, corresponding to different application scenarios. The UEP design is especially beneficial in a slow fading channel, as it allows for a gradual performance degradation with the decreasing receive SNR. Average rate advantage is shown to quantify this gain.
  • Keywords
    AWGN channels; channel capacity; channel coding; decoding; error correction codes; error statistics; fading channels; optimisation; AWGN channel; bit error rate; bits grouping; capacity-approaching component code; fading channel; multilevel coding; multistage decoding; nonuniform constellation; parallel independent decoding; symmetric information rate; unequal error protection code design; utility maximization problem; AWGN; Bit error rate; Decoding; Degradation; Error correction codes; Euclidean distance; Fading; Information rates; Modulation coding; Upper bound;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory, 2008. ISIT 2008. IEEE International Symposium on
  • Conference_Location
    Toronto, ON
  • Print_ISBN
    978-1-4244-2256-2
  • Electronic_ISBN
    978-1-4244-2257-9
  • Type

    conf

  • DOI
    10.1109/ISIT.2008.4595346
  • Filename
    4595346