DocumentCode :
2519767
Title :
Optical alignment of dual-axis MEMS based scanning optical probe for Optical Coherence Tomography (OCT) application
Author :
Khairyanto, Ahmad ; Premachandran, C.S. ; Chen, W.S.K. ; Singh, Janak ; Chandrappan, Jayakrishnan ; Lau, John H. ; Xu, Yingshun
Author_Institution :
Inst. of Microelectron., A*STAR, Singapore, Singapore
fYear :
2008
fDate :
9-12 Dec. 2008
Firstpage :
945
Lastpage :
950
Abstract :
In this paper we present the alignment process for a dual-axis electro-thermal actuated MEMS mirror, silicon optical bench (SiOB)-based probe for endoscopic optical coherence tomography (BOCT). The proposed optical design of the endoscope consists of the propagation of broadband low coherence light source from a 1310 nm laser source thru optical fiber, graded index (GRIN) lens, MEMS scanning mirror to the sample and back. The alignment approach undertaken consists of both passive and active elements. The passive element involves mounting and passively aligning the GRIN lens and MEMS scanning mirror onto trenches etched on separate SiOBs. This is followed by an active alignment of the two optical elements by first mounting each bench onto a five-axis stage rigged with a customized aluminum jig and a goniometer. An average double-pass coupling efficiency of 63.3% was achieved experimentally which was in line with optical simulation results. A fully functional probe was assembled and the cross-sectional images obtained are then presented within the paper. The difference in coupling efficiency resulting from the experiment/simulation and actual assembled probe is then reported and commented upon.
Keywords :
elemental semiconductors; gradient index optics; lenses; micromirrors; optical design techniques; optical fibres; optical tomography; silicon; Si; dual-axis MEMS; graded index lens; mirror; optical alignment; optical coherence tomography; optical fiber; scanning optical probe; silicon optical bench; wavelength 1310 nm; Assembly; Endoscopes; Lenses; Micromechanical devices; Mirrors; Optical design; Optical propagation; Probes; Silicon; Tomography;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
Type :
conf
DOI :
10.1109/EPTC.2008.4763551
Filename :
4763551
Link To Document :
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