DocumentCode :
2519854
Title :
Linearizing ideal A/D converters via analog and digital dither: Analytical study
Author :
Wagdy, Mahmoud Fawzy ; Goff, Michael
Author_Institution :
Dept. of Electr. Eng., California State Univ., Long Beach, CA, USA
fYear :
1993
fDate :
18-20 May 1993
Firstpage :
154
Lastpage :
162
Abstract :
This study is a continuation of previous work by M. F. Wagdy (1989). The authors further investigate the effect of various dither forms, i.e., with different probability density functions (PDFs), on the average observed transfer characteristics of ideal A/D converters (ADCs). The effect of analog dither on the averaged transfer characteristics is illustrated. Different dither forms are considered: rectangular, triangular, and Gaussian. The deviation of the ADC characteristics from the ideal straight line is evaluated for these dither forms using the concept of nonlinearity spectra developed earlier. Results are also compared with simulations based on the mean square error criterion. Two cases of digital dither are investigated: one with a rectangular envelope and the other with a triangular envelope. Effects of dither peak-to-peak values and number of PDF impulses are investigated. A quantitative basis is provided for replacing analog dither with the easier to implement digital dither
Keywords :
analogue-digital conversion; digital simulation; linearisation techniques; probability; signal processing; Gaussian dither; analog dither; average observed transfer characteristics; digital dither; dither peak-to-peak values; ideal A/D converters; mean square error criterion; nonlinearity spectra; probability density functions; rectangular dither; rectangular envelope; triangular dither; triangular envelope; Analog-digital conversion; Analytical models; Character generation; Computer simulation; Convolution; Linearity; Quantization; Random number generation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
Type :
conf
DOI :
10.1109/IMTC.1993.382660
Filename :
382660
Link To Document :
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