DocumentCode
2520028
Title
Air-backed Al/ZnO/Al film bulk acoustic resonator without any support layer
Author
Zhang, Hao ; Kim, Eun Sok
Author_Institution
Dept. of EE-Electrophys., Univ. of Southern California, Los Angeles, CA, USA
fYear
2002
fDate
2002
Firstpage
20
Lastpage
26
Abstract
An air-backed, Al/ZnO/Al film-bulk-acoustic resonator (FBAR) which is free-standing has been fabricated. Unlike a conventional FBAR structure, the newly fabricated resonator does not employ any supporting layer below or above it, but the whole resonator body (consisting of a ZnO piezoelectric layer sandwiched by two aluminum layers) suspends by itself in the air. Its electromechanical coupling constant (kt2) is twice larger than that of a similarly made FBAR with 0.9 μm thick silicon-nitride support layer. Moreover, its quality factors at series resonant frequency and parallel resonant frequency around 1.5 GHz have been measured to be 1,322 and 513 (six times and three times larger than those in the conventional FBAR with 0.9 μm thick Si3N4 diaphragm, respectively). This newly fabricated resonator will be excellent for wide bandwidth filters because of its large electromechanical coupling constant and high quality factor (and thus high figure of merit). The free-standing air-backed FBAR is sturdy enough to survive from a shock test of being dropped on to a desk from one meter height. A layer of 0.5 μm thick parylene deposited and patterned over the Al bridge is proven to enhance the sturdiness of the structure greatly.
Keywords
Q-factor; acoustic resonators; aluminium; bulk acoustic wave devices; electromechanical effects; mechanical testing; plastic packaging; polymer films; reliability; zinc compounds; 0.5 micron; 0.9 micron; Al-ZnO-Al; Si3N4; Si3N4 diaphragm; air-backed Al/ZnO/Al film bulk acoustic resonator; electromechanical coupling constant; figure of merit; free-standing air-backed FBAR; mass loading effect; parallel resonant frequency; patterned parylene layer; quality factors; series resonant frequency; shock test survival; silicon-nitride support layer; structure sturdiness; support layer-free structure; suspended resonator body; wide bandwidth filters; Aluminum; Bandwidth; Electric shock; Film bulk acoustic resonators; Frequency measurement; Q factor; Resonant frequency; Resonator filters; Thickness measurement; Zinc oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN
0-7803-7082-1
Type
conf
DOI
10.1109/FREQ.2002.1075850
Filename
1075850
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