DocumentCode :
2520046
Title :
Analysis and experiment of HBAR frequency spectra and applications to characterize the piezoelectric thin film and to HBAR design
Author :
Pao, Shih-Yung ; Chao, Min-Chiang ; Wang, Zuoqing ; Chiu, Chh-Hung ; Lan, Kung-Chih ; Huang, Zi-Neng ; Shih, Lung-Rung ; Wang, Chi-Lin
Author_Institution :
TXC Corp., Taoyuan, Taiwan
fYear :
2002
fDate :
2002
Firstpage :
27
Lastpage :
35
Abstract :
In this paper, we present the resonance frequency spectra features of a composite resonator consisting of a piezoelectric film and a substrate plate. Based on those features, a direct method to characterize the piezoelectric film with two electrodes is presented. By directly using the parallel and series resonant frequency spectra of the HBAR, the electromechanical coupling factor, the density and the elastic constant of the piezoelectric film can be obtained directly. Some problems related to the accuracy of the method, especially the effect of the electrodes, are discussed.
Keywords :
acoustic resonators; bulk acoustic wave devices; crystal resonators; piezoelectric thin films; HBAR design; HBAR frequency spectra; electrode effects; electromechanical coupling factor; parallel resonant frequency spectra; piezoelectric film density; piezoelectric film elastic constant; piezoelectric film/substrate plate composite resonator; piezoelectric thin film characterization; resonance frequency spectra; series resonant frequency spectra; Acoustic measurements; Chaos; Electrodes; Frequency measurement; Impedance; Numerical simulation; Piezoelectric films; Resonance; Resonant frequency; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
Type :
conf
DOI :
10.1109/FREQ.2002.1075851
Filename :
1075851
Link To Document :
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