Title :
Development of Performance Characterization Methods for Optoelectronic Circuit Boards
Author :
Chandrappan, Jayakrishnan ; Kuruveettil, Haridas ; Wei, Tan Chee ; Liang, Calvin Teo Wei ; Ramana, Pamidighantam V. ; Suzuki, Kenji ; Shioda, Tsiyoshi ; Lau, John
Author_Institution :
Inst. of Microelectron., A STAR, Singapore, Singapore
Abstract :
In this paper, we illustrate the performance evaluation methods for optoelectronic circuit boards (OECBs). Here we report the details of the evaluation techniques for a bidirectional OECB developed to operate at 10 Gbps using a flip chip SMT optical transceiver. The evaluation techniques include DC and high speed optical characterization of individual component as well as at interconnect level. Performance evaluation of optical waveguide, optical DC characterization of VCSEL and photo diode, high speed optical characterization of transmitter, receiver and optical link are described here in detail.
Keywords :
flip-chip devices; integrated optoelectronics; optical interconnections; optical links; optical receivers; optical transmitters; optical waveguides; photodiodes; printed circuits; surface emitting lasers; surface mount technology; transceivers; VCSEL; bidirectional OECB; flip chip SMT optical transceiver; interconnect; optical link; optical waveguide; optoelectronic circuit boards; performance evaluation; photodiode; receiver; transmitter; Flip chip; High speed optical techniques; Optical devices; Optical interconnections; Optical receivers; Optical transmitters; Optical waveguides; Printed circuits; Surface-mount technology; Transceivers;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763577
