Title :
Electrically forced thickness-shear vibration of a crystal plate under time-dependent biasing deformations
Author :
Yang, J.S. ; Zhang, X. ; Kosinski, J.A. ; Pastore, R.A., Jr.
Author_Institution :
Dept. of Eng. Mech., Nebraska Univ., Lincoln, NE, USA
Abstract :
Electrically forced thickness-shear vibrations of a Y-cut quartz plate resonator under time-dependent extensional biasing vibrations are studied using the two-dimensional equations for small deformations superposed on finite biasing deformations in electroelastic plates. It is shown that the thickness-shear vibration is governed by the well known Mathieu equation with a time-dependent coefficient and a driving term. Two approximate analytical solutions are obtained. One may be called a quasi-static solution which is valid when the frequency of the biasing extensional deformation is much lower than the frequency of the thickness-shear vibration. The other is a first-order perturbation solution valid when the biasing deformations are infinitesimal. Both solutions show that the static and motional capacitances of the resonator become time-dependent with a frequency the same as that of the biasing deformation.
Keywords :
capacitance; crystal resonators; elastic deformation; elastic waves; perturbation techniques; piezoelectricity; vibrations; Mathieu equation driving term; SiO2; Y-cut quartz plate resonator; biasing extensional deformation frequency; crystal plate electrically forced thickness-shear vibrations; electroelastic plates; finite biasing deformations; first-order perturbation solution; motional resonator capacitances; quasi-static analytical solution; static resonator capacitances; superposed small deformation 2D equations; time-dependent coefficients; time-dependent extensional biasing deformations; Acceleration; Amplitude modulation; Capacitance; Crystals; Equations; Frequency modulation; Missiles; Satellites; Tensile stress; Vibrations;
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
DOI :
10.1109/FREQ.2002.1075864