Small and large signal device characterization made easier and faster with an integrated test system

Author

Ferrero, Andrea ; Pisani, Umberto ; Sanpietro, Ferdinando

Author_Institution

Dipartimento di Elettronica, Politecnico di Torino, Italy

fYear

1993

fDate

18-20 May 1993

Firstpage

6

Lastpage

9

Abstract

The authors describe a microwave test set that can be automatically reconfigured to perform linear and nonlinear characterization. Particular attention was devoted to speeding up the load pull contour tracking process. The test set measures S-parameters, power levels, gains, and harmonics up to 26 GHz. The software can set different loads randomly or by a special algorithm which automatically tracks power, gain, or efficiency contours. The test set was used to fully characterize several MESFETs up to 20 GHz. The system can be computer or manually driven and is particularly oriented to production tests

Keywords

S-parameters; automatic test equipment; gain measurement; harmonics; microwave measurement; production testing; 20 GHz; 26 GHz; MESFETs; S-parameters; gains; harmonics; integrated test system; linear characterisation; load pull contour tracking; microwave test set; nonlinear characterization; power levels; production tests; Automatic testing; Gain measurement; MESFETs; Microwave devices; Performance evaluation; Power measurement; Power system harmonics; Production systems; Scattering parameters; Software algorithms;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE

Conference_Location

Irvine, CA

Print_ISBN

0-7803-1229-5

Type

conf

DOI

10.1109/IMTC.1993.382691

Filename

382691