• DocumentCode
    2520584
  • Title

    A Physics-of-failure based Prognostic Method for Power Modules

  • Author

    Yin, C.Y. ; Lu, H. ; Musallam, M. ; Bailey, C. ; Johnson, C.M.

  • Author_Institution
    Sch. of Comput. & Math. Sci., Univ. of Greenwich, London, UK
  • fYear
    2008
  • fDate
    9-12 Dec. 2008
  • Firstpage
    1190
  • Lastpage
    1195
  • Abstract
    This paper describes a physics of failure (PoF) based prognostic method for power electronic modules. This method allows the reliability performance of power modules to be assessed in real time. A compact thermal model was firstly constructed to investigate the relationship between the power dissipation and the temperature in the power module. Such relationship can be used for fast calculation of junction temperature and the temperatures at each interface inside power modules. The predicted temperature profile was then analyzed using a rainflow counting method so that the number of thermal cycles with different temperature ranges can be calculated. A reduced order thermo-mechanical model was also constructed to enable a fast calculation of the accumulated plastic strain in the solder material under different loading conditions. The information of plastic strains was then used in the lifetime prediction model to predict the reliability of the solder interconnect under each regular loading condition. Based on the linear damage rule and the number of cycles calculated from the rain flow counting algorithm, the accumulated damage in the power module over the whole period of usage can be predicted. As a demonstration, this method has been applied to a typical IGBT half bridge module used in aircraft applications.
  • Keywords
    bridge circuits; failure analysis; insulated gate bipolar transistors; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; modules; plastic deformation; power bipolar transistors; power integrated circuits; semiconductor device reliability; soldering; IGBT half bridge module; compact thermal model; lifetime prediction model; linear damage rule; physics of failure based prognostic method; plastic strain; power dissipation-temperature relationship; power electronic module; rainflow counting method; reduced order thermomechanical model; reliability; solder interconnect; solder material; temperature profile; thermal cycles; Capacitive sensors; Multichip modules; Physics; Plastics; Power dissipation; Power electronics; Predictive models; Rain; Temperature distribution; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-2117-6
  • Electronic_ISBN
    978-1-4244-2118-3
  • Type

    conf

  • DOI
    10.1109/EPTC.2008.4763591
  • Filename
    4763591