DocumentCode
2520584
Title
A Physics-of-failure based Prognostic Method for Power Modules
Author
Yin, C.Y. ; Lu, H. ; Musallam, M. ; Bailey, C. ; Johnson, C.M.
Author_Institution
Sch. of Comput. & Math. Sci., Univ. of Greenwich, London, UK
fYear
2008
fDate
9-12 Dec. 2008
Firstpage
1190
Lastpage
1195
Abstract
This paper describes a physics of failure (PoF) based prognostic method for power electronic modules. This method allows the reliability performance of power modules to be assessed in real time. A compact thermal model was firstly constructed to investigate the relationship between the power dissipation and the temperature in the power module. Such relationship can be used for fast calculation of junction temperature and the temperatures at each interface inside power modules. The predicted temperature profile was then analyzed using a rainflow counting method so that the number of thermal cycles with different temperature ranges can be calculated. A reduced order thermo-mechanical model was also constructed to enable a fast calculation of the accumulated plastic strain in the solder material under different loading conditions. The information of plastic strains was then used in the lifetime prediction model to predict the reliability of the solder interconnect under each regular loading condition. Based on the linear damage rule and the number of cycles calculated from the rain flow counting algorithm, the accumulated damage in the power module over the whole period of usage can be predicted. As a demonstration, this method has been applied to a typical IGBT half bridge module used in aircraft applications.
Keywords
bridge circuits; failure analysis; insulated gate bipolar transistors; integrated circuit interconnections; integrated circuit modelling; integrated circuit reliability; modules; plastic deformation; power bipolar transistors; power integrated circuits; semiconductor device reliability; soldering; IGBT half bridge module; compact thermal model; lifetime prediction model; linear damage rule; physics of failure based prognostic method; plastic strain; power dissipation-temperature relationship; power electronic module; rainflow counting method; reduced order thermomechanical model; reliability; solder interconnect; solder material; temperature profile; thermal cycles; Capacitive sensors; Multichip modules; Physics; Plastics; Power dissipation; Power electronics; Predictive models; Rain; Temperature distribution; Thermomechanical processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location
Singapore
Print_ISBN
978-1-4244-2117-6
Electronic_ISBN
978-1-4244-2118-3
Type
conf
DOI
10.1109/EPTC.2008.4763591
Filename
4763591
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