Title :
Point pattern matching based on manifold embedding
Author :
Yan, Weidong ; Tian, Zheng ; Wen, Jinhuan ; Pan, Lulu
Author_Institution :
Sch. of Sci., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
The problem of point pattern matching (PPM) is frequently encountered in computer vision, such as image registration and image matching. This paper investigates the manifold approaches to the problem of point pattern matching, and proposes a manifold correspondence based on Locally Linear Embedding (LLE). Our method operates on embeddings of the two data sets in the manifold space so as to get embedding features, which is invariance to rotation, scaling and translation (RST). By comparing the manifold embeddings of the points, we locate correspondences. We evaluate the method on both synthetic and real-world data, and experimental results demonstrate its high accuracy and robust to outliers.
Keywords :
computer vision; pattern matching; computer vision; data sets; locally linear embedding; manifold embedding; point pattern matching; rotation; scaling; translation; Computer vision; Image reconstruction; Information geometry; Kernel; Laboratories; Machine learning; Matrix decomposition; Pattern matching; Principal component analysis; Remote sensing; Locally Linear Embedding (LLE); Manifold embedding; Non-rigid transformation; Point Pattern Matching (PPM);
Conference_Titel :
Image Analysis and Signal Processing (IASP), 2010 International Conference on
Conference_Location :
Zhejiang
Print_ISBN :
978-1-4244-5554-6
Electronic_ISBN :
978-1-4244-5556-0
DOI :
10.1109/IASP.2010.5476067