Title :
Comparative study on deconvolution function dependencies of RTN/RDF effect estimation errors in analyzing sub-nm-scaled SRAM margins
Author :
Yamauchi, Hiroyuki ; Somha, Worawit
Author_Institution :
Inf. Intell. Syst., Fukuoka Inst. of Technol., Fukuoka, Japan
Abstract :
Comparative study between the proposed technique and MATLAB-built-in deconvolution-functions with regard to deconvolution errors is discussed, which have a crucial impact in reversing the effects of convolution with Random Telegraph Noise (RTN) and Random Dopant Fluctuation (RDF) on overall SRAM margin variations. The proposed algorithm successfully avoids noise amplification thanks to eliminating the need for any operations of differential, division, and maximum-likelihood gradient sequence. This advantage over the MATLAB-built-in deconvolution-functions has been demonstrated for the first time with applying it to a real analysis for the effects of the RTN/RDF on the overall SRAM margin variations. It has been shown that the proposed technique can reduce fail-bit-count estimation error based on the convolution of the deconvoluted-RTN with the RDF by 1014-fold compared with the MATLAB-built-in deconvolution-functions.
Keywords :
SRAM chips; deconvolution; integrated circuit design; integrated circuit noise; integrated circuit reliability; random noise; MATLAB deconvolution functions; RTN-RDF effect; SRAM margin variations; deconvolution errors; fail-bit-count estimation error; maximum-likelihood gradient sequence; random dopant fluctuation; random telegraph noise; Convolution; Deconvolution; MATLAB; Noise; Probability density function; Random access memory; Resource description framework; Deconvolution; MATLAB-deconvolution function; Random telegraph noise; SRAM margin variation;
Conference_Titel :
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location :
College Station, TX
Print_ISBN :
978-1-4799-4134-6
DOI :
10.1109/MWSCAS.2014.6908394