Title :
SIFT algorithm analysis and optimization
Author_Institution :
Commun. & Inf. Eng. Coll., Xi´´an Univ. of Sci. & Technol., Xi´´an, China
Abstract :
Due to good invariance of scale, rotation, illumination, SIFT (Scale Invariant Feature Transform) descriptor is commonly used in image matching. The steps of extracting SIFT feature are analyzed in detail, and SIFT Key-point location is optimized. The Chamfer distance is used in this article; it decreases computation time and improves the accuracy of image matching. The experimental results show that the algorithm can reduce time complexity and maintain robust quality at the same time.
Keywords :
feature extraction; image matching; optimisation; transforms; Chamfer distance; SIFT algorithm analysis; feature extraction; image matching; optimization; scale invariant feature transform; Algorithm design and analysis; Data mining; Educational institutions; Feature extraction; Image analysis; Image matching; Information analysis; Lighting; Pixel; Robustness; Chamfer distance; Comparability measurement; SIFT; analysis and optimization; image matching;
Conference_Titel :
Image Analysis and Signal Processing (IASP), 2010 International Conference on
Conference_Location :
Zhejiang
Print_ISBN :
978-1-4244-5554-6
Electronic_ISBN :
978-1-4244-5556-0
DOI :
10.1109/IASP.2010.5476084
