• DocumentCode
    2521050
  • Title

    Electric field analysis at the triple junction of a optimum profile disc type spacer in SF6 gas insulated system with abnormalities under DC voltages

  • Author

    Chowdary, D. Deepak ; Amarnath, J.

  • Author_Institution
    Dr. L. Bullayya Coll. of Eng. for Women, Visakhapatnam, India
  • fYear
    2011
  • fDate
    16-19 Oct. 2011
  • Firstpage
    215
  • Lastpage
    218
  • Abstract
    In Gas Insulated Systems the breakdown strength of SF6 gas is badly affected by locally enhanced electric fields due to protrusions and delamination. Metal insert electrodes, which are used in GIS, reduces stresses near the triple junctions with simultaneous rise in the stresses elsewhere along spacer surface. AC-GIS are in operation for a long time but there is a limited knowledge for DC application. In the case of DC-GIS, charges invariably accumulate over a period of time along the spacer surface. The electric field distribution around solid spacer is greatly altered by the accumulated surface charges. In this work, the electric field distribution with DC as applied voltage is studied at the triple junction for a cone type spacer with and without metal insert along with the effect of delamination and protrusions on the surface of the insulator. Finite Element Method (FEM), one of the proven numerical method, is used for computing the electric fields at various points under consideration.
  • Keywords
    SF6 insulation; electric breakdown; finite element analysis; gas insulated switchgear; AC-GIS; DC voltages; DC-GIS; FEM; SF6 gas breakdown strength; SF6 gas insulated system; delamination effect; electric field analysis; electric field distribution; finite element method; gas insulated systems; locally enhanced electric fields; numerical method; optimum profile disc type spacer; protrusion effect; solid spacer; spacer surface; switchgear; triple junctions; Cathodes; Electric fields; Finite element methods; Junctions; Metals; Sulfur hexafluoride;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
  • Conference_Location
    Cancun
  • ISSN
    0084-9162
  • Print_ISBN
    978-1-4577-0985-2
  • Type

    conf

  • DOI
    10.1109/CEIDP.2011.6232635
  • Filename
    6232635