Title :
On the error linear complexity profiles of binary sequences of period 2n
Author :
Etzion, Tuvi ; Kalouptsidis, Nicholas ; Kolokotronis, Nicholas ; Limniotis, Konstantinos ; Paterson, Kenneth G.
Author_Institution :
Dept. of Comput. Sci., Technion - Israel Inst. of Technol., Haifa
Abstract :
This paper studies the error linear complexity profiles of binary sequences with period 2n. We give a precise categorization of those sequences having 2 distinct critical points in their profiles, as well as an enumeration of these sequences. We also give an upper bound on the maximum number of distinct critical points that the profile of a sequence can have, along with several constructions for sequences having many distinct critical points.
Keywords :
binary sequences; binary sequences; distinct critical points; error linear complexity profiles; Binary sequences; Cities and towns; Computer errors; Computer science; Cryptography; Informatics; Information security; Length measurement; Paper technology; Upper bound;
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
DOI :
10.1109/ISIT.2008.4595421
