• DocumentCode
    2521213
  • Title

    Autonomous 2D microparticle manipulation based on visual feedback

  • Author

    Onal, Cagdas D. ; Sitti, Metin

  • Author_Institution
    Carnegie Mellon Univ., Pittsburgh
  • fYear
    2007
  • fDate
    4-7 Sept. 2007
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Autonomous two-dimensional manipulation of microparticles to form patterns under an optical microscope by pushing and pulling them with a sharp nanoprobe is presented. Camera calibration is done by an iterative sliding-mode parameter observer designed to satisfy the Lyapunov stability criterion. Estimated parameters are also used to increase the bandwidth on position control. Individual particles are manipulated in linear trajectories, utilizing a procedure that allows the particles to stick near the tip for horizontal motion and to get released for vertical motion. Patterns (and assemblies) of particles are generated using a planning algorithm that orders individual manipulations based on the blockage of linear trajectories by other particles or target positions. Basically, the particle that blocks the most number of trajectories is positioned to the target position that blocks the least number of trajectories. This ordering algorithm is a minimization of blockages to the linear trajectories and hence, performs better than the conventional distance-based approaches. Efficiency of the approach is demonstrated on experimental results, positioning 4.5 mum diameter polystyrene particles on a flat glass substrate autonomously. Average accuracy of individual manipulations is less than 0.64 mum.
  • Keywords
    Lyapunov methods; atomic force microscopy; feedback; iterative methods; micromanipulators; motion control; observers; position control; robot vision; stability; variable structure systems; visual servoing; Lyapunov stability criterion; autonomous 2D microparticle manipulation; blockage minimization; camera calibration; flat glass substrate; horizontal motion; iterative sliding-mode parameter observer; linear trajectory; nanoprobe; optical microscope; particle assembly; particle pattern; particle positioning; planning algorithm; polystyrene particles; position control; vertical motion; visual feedback; Assembly; Bandwidth; Calibration; Cameras; Lyapunov method; Optical feedback; Optical microscopy; Parameter estimation; Position control; Trajectory; Micromanipulation; atomic force microscopy; sliding mode control; visual servoing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced intelligent mechatronics, 2007 IEEE/ASME international conference on
  • Conference_Location
    Zurich
  • Print_ISBN
    978-1-4244-1263-1
  • Electronic_ISBN
    978-1-4244-1264-8
  • Type

    conf

  • DOI
    10.1109/AIM.2007.4412472
  • Filename
    4412472