• DocumentCode
    252128
  • Title

    A novel readout circuit for on-sensor multispectral classification

  • Author

    Ghasemi, Javad ; Zarkesh-Ha, Payman ; Krishna, Sanjay ; Godoy, Sebastian E. ; Hayat, Majeed M.

  • Author_Institution
    ECE Dept., Univ. of New Mexico, Albuquerque, NM, USA
  • fYear
    2014
  • fDate
    3-6 Aug. 2014
  • Firstpage
    386
  • Lastpage
    389
  • Abstract
    A new readout integrated circuit (ROIC) for multispectral classification is presented. The ROIC is designed to utilize the spectral response tunability of dot-in-a-well (DWELL) infrared photodetector to exploit the possibility of real-time on-chip multispectral imaging for classification in analog domain. The unit cells are designed to include all necessary elements needed for spectral classification, including high-voltage time-varying positive and negative biases, bipolar integration, and selective sample-and-hold circuits. A test chip was designed and fabricated using TSMC´s 0.35 μm high-voltage technology. The test chip has successfully completed its initial functional tests and is ready for hybridization to a DWELL focal-plane array.
  • Keywords
    CMOS analogue integrated circuits; CMOS image sensors; image classification; infrared detectors; readout electronics; DWELL focal-plane array; ROIC; TSMC high-voltage technology; analog domain classification; bipolar integration; dot-in-a-well infrared photodetector; for on-sensor multispectral classification; functional tests; high-voltage time-varying positive biases; negative biases; readout integrated circuit; real-time on-chip multispectral imaging; selective sample-and-hold circuits; size 0.35 mum; spectral response tunability; test chip; unit cells; Arrays; Capacitors; Decoding; Integrated circuits; Photoconductivity; Photodetectors; Rocks; CMOS image sensors; ROIC; Readout integrated circuit; multispectral classification; smart pixel;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
  • Conference_Location
    College Station, TX
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4799-4134-6
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2014.6908433
  • Filename
    6908433