Title :
A high-resolution all-digital duty-cycle corrector with a new pulse-width detector
Author :
Ke, Ji-Wei ; Huang, Shi-Yu ; Kwai, Ding-Ming
Author_Institution :
Electr. Eng. Dept., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
A high-resolution all-digital duty-cycle corrector (ADDCC) with a novel pulse-width detector in cell-based design is presented. This work provides a wider acceptable duty-cycle range from 10% to 90% and a larger operation frequency range from 100MHz to 3.6GHz. We rely on an “Exponentially Segmented Binary Search” method for increasing the locking speed. Based on three types of circuit elements - Expand Element, Shrink Element, and Fine-Tuning Element, the clock´s pulse width could be controlled accurately by a resolution as low as 2.8ps, and thereby achieving 50% duty-cycle within less than ±0.5% error in SPICE simulation. This proposed DCC, equipped with a new Pulse-Width Detector which can not only detect 50% duty-cycle precisely but also dynamically track the variation in operating conditions. A test chip has been taped out to validate this design. The simulation results in a 90nm CMOS process at 1V indicate that the peak-to-peak jitter is 6.2ps at 2GHz and the power consumption is 3.8mW.
Keywords :
CMOS digital integrated circuits; SPICE; circuit simulation; circuit tuning; clocks; integrated circuit noise; integrated circuit testing; jitter; CMOS process; SPICE simulation; cell-based design; circuit element; clock pulse width; expand element; exponentially segmented binary search; fine-tuning element; frequency 100 MHz to 3.6 GHz; high-resolution all-digital duty-cycle corrector; locking speed; peak-to-peak jitter; power 3.8 mW; pulse-width detector; shrink element; size 90 nm; test chip; voltage 1 V; Silicon; Solid modeling; Thermal expansion; Turning;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
DOI :
10.1109/EDSSC.2010.5713749