DocumentCode :
2521602
Title :
Exceptionally-enhanced Q-factor sapphire-loaded-cavity TE01δ mode resonators
Author :
Hartnett, J.G. ; Tobar, M.E. ; Cros, D. ; Krupka, J. ; Guillon, P.
Author_Institution :
FSM Res. Group, Univ. of Western Australia, Crawley, WA, Australia
fYear :
2002
fDate :
2002
Firstpage :
559
Lastpage :
564
Abstract :
An innovative method of enhancing the quality factor of TE01δ cavity resonators with a dielectric tube made of monolithic sapphire is presented. Very high Q-factor is achieved by employing a Bragg reflection technique. A TE01δ mode in a copper cavity was measured to have a Q-factor of 1×105 at 8.78 GHz and 290 K. This is only 30% less than the limit due to the loss tangent of the dielectric material. The technique confines electromagnetic energy in the sapphire dielectric and in the vacuum well away from the cavity walls, thus reducing the surface losses in the copper shield. The technique offers some significant advantages over other methods. One advantage is the very low spurious mode density, which can improve filter and resonator design capabilities. Another is the small compact design, with a single sapphire piece, as compared to previously published Bragg reflection techniques. Finite element simulations and experimental data for this method were compared and found to be in very good agreement. The cavity dimensions were optimized to achieve maximum quality-factor.
Keywords :
Q-factor; cavity resonators; dielectric resonators; losses; microwave devices; sapphire; 290 K; 8.78 GHz; Bragg reflection technique; TE01δ mode cavity resonators; compact design; enhanced Q-factor sapphire-loaded cavity resonators; finite element simulations; high-Q microwave resonator design; low spurious mode density; monolithic sapphire dielectric tube; quality factor enhancement; surface losses reduction; very high Q-factor; Cavity resonators; Copper; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Electromagnetic measurements; Loss measurement; Q factor; Reflection; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium and PDA Exhibition, 2002. IEEE International
Print_ISBN :
0-7803-7082-1
Type :
conf
DOI :
10.1109/FREQ.2002.1075945
Filename :
1075945
Link To Document :
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