DocumentCode
2521682
Title
High thermal conductivity composite sheets with controlled nanostructures for electric devices
Author
Takezawa, Yoshitaka ; Nishiyama, Tomoo ; Katagi, Hideyuki ; Hara, Naoki
Author_Institution
Tsukuba Res. Lab., Hitachi Chem. Co., Ltd., Tsukuba, Japan
fYear
2011
fDate
16-19 Oct. 2011
Firstpage
326
Lastpage
329
Abstract
We have developed the novel network polymer with mesogen to improve the thermal conductivity of epoxy resins by controlling the higher order structure. To obtain the evidence for the higher order structure, we carried out direct observations at both mesoscopic and microscopic scales. The developed resin shows an obvious lattice structure in the transmission electron microscope (TEM) image and large domains with sizes of about several micrometers in the atomic force microscope (AFM) image and the polarized optical microscope (POM). On the other hand, no domains of order-structures can be recognized in the TEM, AFM images and POM of conventional resin. Furthermore, the formed nanostructure of composite is confirmed by the small-angle X-ray diffraction. Thermal conductivities of developed epoxy resins are 1.0 W/m·K at a maximum and five times higher than that of the conventional ones. We mixed these resins with conventional ceramic fillers, then the new epoxy composites (10 to 15 W/m·K) have been obtained. Fabricated B-stage (pre-cured) sheet is flexible and the cured one shows good electrical properties. Thus the developed high thermal conductive composites may be applicable to the insulating adhesive sheets for power devices, etc.
Keywords
X-ray diffraction; atomic force microscopy; epoxy insulation; power electronics; thermal conductivity; transmission electron microscopes; AFM images; B-stage sheet; TEM; atomic force microscope; ceramic fillers; electric devices; electrical properties; epoxy resins; high thermal conductivity composite sheets; insulating adhesive sheets; mesogen; mesoscopic scales; microscopic scales; nanostructures; network polymer; polarized optical microscope; power devices; small-angle X-ray diffraction; thermal conductive composites; thermal conductivities; transmission electron microscope; Atomic force microscopy; Conductivity; Epoxy resins; Nanostructures; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
Conference_Location
Cancun
ISSN
0084-9162
Print_ISBN
978-1-4577-0985-2
Type
conf
DOI
10.1109/CEIDP.2011.6232662
Filename
6232662
Link To Document