DocumentCode :
2521763
Title :
High G Impact Resistant Digital Data Recorder For Missile Flight Testing
Author :
Hill-Lindsay, Joseph W. ; Yuen, John
Author_Institution :
Northrop Electronics System Div.
fYear :
1993
fDate :
22-24 Jun 1993
Firstpage :
109
Lastpage :
110
Keywords :
Costs; Data acquisition; Electric shock; Electronic equipment testing; Missiles; Nonvolatile memory; Packaging; Space technology; System testing; Telemetry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nonvolatile Memory Technology Review, 1993
Print_ISBN :
0-7803-1290-2
Type :
conf
DOI :
10.1109/NVMT.1993.696966
Filename :
696966
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2521763
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