DocumentCode
2521895
Title
Analysis and optimization of mismatch and parasitics in pipelined ADCs
Author
Wang, Yu ; Yang, Hai-gang ; Cheng, Xin ; Yin, Tao
Author_Institution
Inst. of Electron., Chinese Acad. of Sci. (CAS), Beijing, China
fYear
2010
fDate
15-17 Dec. 2010
Firstpage
1
Lastpage
4
Abstract
The mismatch and parasitics of layout and process in pipelined ADCs are analyzed in this paper and an optimized system has been implemented. Based on the model establishment of the proposed ADC, the offset of input in each stage and the fluctuation of reference voltage, which degrades the effective resolution of pipelined ADCs, caused by transistors mismatches and parasitic effects are modeled and estimated. The error bounds are also derived to optimize the ADC´s properties. After careful design in schematic and layout, a 12bit pipelined ADC is realized in a commercial CMOS 0.35μm process. The post layout simulations show that the circuit achieves 69.3dB signal-to-noise-and-distortion ratio (SNDR), 80.1dB spurious free dynamic range (SFDR) and -80.1dB total harmonic distortion (THD) operating up to the 40MHz sampling clock, which proves the beneficial of the analysis and optimization.
Keywords
CMOS integrated circuits; analogue-digital conversion; harmonic distortion; CMOS process; analog-to-digital converters; mismatch optimization; parasitic effects; pipelined ADC; signal to noise and distortion ratio; size 0.35 mum; total harmonic distortion; transistors mismatch; word length 12 bit; Integrated circuit modeling; Layout; Mathematical model; Optimization; Routing; Semiconductor device modeling; Transistors; layout and process; model; non-ideal; pipelined ADC;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-9997-7
Type
conf
DOI
10.1109/EDSSC.2010.5713768
Filename
5713768
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