Title :
A low-voltage charge pump with wide current driving capability
Author :
Wong, Oi-Ying ; Tam, Wing-Shan ; Kok, Chi-Wah ; Wong, Hei
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Hong Kong, China
Abstract :
A high current driving capability charge pump circuit is proposed. By adopting the dynamic boosting circuit, the overdrive voltages of all the charge transfer switches (CTS´s) in the charge pump are maintained for a large loading current. In addition, the largest voltage difference between any of the terminals of all the transistors does not exceed the supply voltage VDD, and solves the gate-oxide overstress problem in the conventional charge pump circuits and enhances the reliability. Other advantages of the proposed charge pump include high pumping efficiency because of no threshold voltage drop and 2-phase operation, without the need of extra power consumption on the logic circuits and drivers. The proposed charge pump circuit is designed and simulated based on a low voltage process. Results show that the charge pump can operate in a wide output current range.
Keywords :
CMOS integrated circuits; charge pump circuits; integrated circuit reliability; low-power electronics; charge transfer switches; current driving capability; dynamic boosting circuit; gate-oxide overstress problem; loading current; low-voltage charge pump; threshold voltage drop; voltage difference; Boosting; Load modeling; Loading; Logic gates; Solids; Switches; Variable speed drives;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
DOI :
10.1109/EDSSC.2010.5713777