Title :
RESET modeling of PCM using thermal budget approach
Author :
Kwong, K.C. ; He, Jin ; Mok, Philip K T ; Chan, Mansun
Author_Institution :
Dept. of ECE, Hong Kong Univ. of Sci. & Technol., Kowloon, China
Abstract :
In this work, the phase transition from crystalline state to amorphous state during RESET programming of a phase change memory is studied. A thermal budget approach is developed to describe the effect of cell structure, input current pulse amplitude and the quenching time on the final resistance after RESET programming. The model has been implemented to a circuit simulator and verified by experimental data reported in the literature.
Keywords :
amorphous state; circuit simulation; phase change memories; phase transformations; quenching (thermal); PCM; RESET modeling; RESET programming; amorphous state; circuit simulator; nonvolatile memory; phase change memory; phase transition; quenching time; thermal budget approach; SPICE Model; nonvolatile memory (NVM); phase change memory (PCM);
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
DOI :
10.1109/EDSSC.2010.5713782
