Title :
Gamma-ray diffractometry method for nondestructive dislocation density control in massive quartz crystals
Author :
Kalashnikova, I. ; Naumov, V. ; Kurbakov, A. ; Sokolov, A. ; Pashkov, S.
Author_Institution :
Scientific-Res. Inst., Moscow, Russia
Abstract :
The investigation of dislocation density in massive quartz crystals was carried out with the help of a γ-ray diffractometer. Statistical dynamic diffraction theory was used for the dislocation density calculations from experimental results. The compared data were obtained for several quartz crystals on the determination of the dislocation density by various means: using a γ-ray diffractometer, X-ray topography and by calculation of etching channels in AT-cut plates for the same crystal. Good agreement between the results obtained by these methods shows that the γ-ray diffractometry method can be a method for nondestructive dislocation concentration control in massive quartz crystals
Keywords :
X-ray diffraction; X-ray topography; dislocation density; etching; gamma-ray diffraction; nondestructive testing; piezoelectric materials; quartz; AT-cut plates; SiO2; X-ray topography; etching channels; gamma-ray diffractometry method; massive quartz crystals; nondestructive dislocation density control; statistical dynamic diffraction theory; Crystallography; Crystals; Distortion measurement; Etching; IEC standards; Nuclear physics; Phonons; Surface topography; Surface treatment; X-ray diffraction;
Conference_Titel :
Frequency Control Symposium, 1996. 50th., Proceedings of the 1996 IEEE International.
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-3309-8
DOI :
10.1109/FREQ.1996.559827
