Title :
Mutual information performance of differential MPSK detection over time-varying channels
Author :
Krusevac, Zarko B. ; Rapajic, Predrag B. ; Kennedy, Rodney A.
Author_Institution :
Australian Nat. Univ., Canberra, ACT
Abstract :
This paper provides mutual information performance analysis of multiple-symbol differential MPSK (M-phase shift keying) over time-correlated, time-varying flat-fading communication channels. A state space approach is used to model time correlation of time varying channel phase. This approach captures the dynamics of time correlated, time-varying channels and enables exploitation of the forward-backward algorithm for mutual information performance analysis. It is shown that the differential decoding implicitly uses a sequence of innovations of the channel process time correlation and this sequence is essentially uncorrelated. It enables utilization of multiple-symbol differential detection, as a form of block-by-block maximum likelihood sequence detection for capacity achieving mutual information performance. It is shown that multiple-symbol differential ML detection of BPSK and QPSK practically achieves the channel information capacity with observation times only on the order of a few symbol intervals.
Keywords :
channel coding; correlation methods; decoding; differential phase shift keying; fading channels; maximum likelihood detection; state-space methods; time-varying channels; M-phase shift keying; block-by-block maximum likelihood sequence detection; differential decoding; forward-backward algorithm; multiple-symbol differential MPSK detection; mutual information performance analysis; state space approach; time correlation; time-varying flat-fading communication channel; Binary phase shift keying; Communication channels; Maximum likelihood decoding; Maximum likelihood detection; Mutual information; Performance analysis; Quadrature phase shift keying; State-space methods; Technological innovation; Time-varying channels;
Conference_Titel :
Information Theory, 2008. ISIT 2008. IEEE International Symposium on
Conference_Location :
Toronto, ON
Print_ISBN :
978-1-4244-2256-2
Electronic_ISBN :
978-1-4244-2257-9
DOI :
10.1109/ISIT.2008.4595493