Title :
Measurement of electronic states in polymer by Kelvin method-effects of UV irradiation
Author :
Kawamoto, Akira ; Suzuoki, Yasuo ; Mizutani, Teruyoshi
Author_Institution :
Fukui Nat. Coll. of Technol., Sabae, Japan
Abstract :
In order to clarify the effects of UV irradiation on surface electronic states of insulating polymers, measurements of contact potential difference by the Kelvin method and of the valence band spectrum by XPS were carried out. A charge transfer range was observed at the metal-insulating polymer interface. The charge transfer range of PVK (polyvinyl carbazole) and PVP (poly-2-vinyl pyridine) was about 165 nm and 55 nm, respectively. The Fermi level of PVK became higher with UV irradiation, whereas that of PVP became lower. This Fermi level behavior is considered to be due to oxidation and morphological changes
Keywords :
Fermi level; X-ray photoelectron spectra; contact potential; oxidation; polymer films; polymer structure; surface states; ultraviolet radiation effects; valence bands; Fermi level; Kelvin method; UV irradiation; XPS; charge transfer range; contact potential difference; film; insulating polymers; metal-insulating polymer interface; morphological changes; oxidation; poly-2-vinyl pyridine; polyvinyl carbazole; surface electronic states; valence band spectrum; Electrostatic measurements; Glass; Gold; Kelvin; Optical films; Plastic insulation; Polymers; Substrates; Surface morphology; Thickness measurement;
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
DOI :
10.1109/ICPADM.2000.876079
