DocumentCode
252264
Title
Analytical methods to assess transient faults effects in logic circuits
Author
Alves de Barros Naviner, Lirida
Author_Institution
Inst. Mines-Telecom, Telecom ParisTech, Paris, France
fYear
2014
fDate
3-6 Aug. 2014
Firstpage
667
Lastpage
670
Abstract
This work addresses transient faults in deep submicron technologies. We focus on reliability assessment approaches highlighting those based on analytical models. The paper includes a description of solutions reported in the literature and discusses their suitability from a reliability improvement perspective.
Keywords
integrated circuit reliability; logic circuits; analytical models; deep submicron technologies; logic circuits; reliability assessment approaches; transient faults effects; Circuit faults; Integrated circuit modeling; Integrated circuit reliability; Logic circuits; Logic gates; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
Conference_Location
College Station, TX
ISSN
1548-3746
Print_ISBN
978-1-4799-4134-6
Type
conf
DOI
10.1109/MWSCAS.2014.6908503
Filename
6908503
Link To Document