Methods of investigation of the properties of the optoelectronic devices with use of atomic force microscopy

In the modern world, the influence the optoelectronic devices on the communications methods are still increasing. Therefore it is very important to And appropriate techniques for design, building, testing, measuring and packaging. The measurement techniques of these devices in nanometer scale help us to solve problems like the quality of the device layers and give us comparison of modeling and experimental results. In this article we present selected techniques of measurement of the optoelectronic devices like solar cells, lasers or photodiodes. We describe techniques like Kelvin probe force microscopy, electrostatic force microscopy and example results obtained in our laboratory.