Title : 
Design of experiments in BDD variable ordering: lessons learned
         
        
            Author : 
Harlow, J.E., III ; Brglez, F.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
         
        
        
        
        
        
            Abstract : 
Applying the design of experiments methodology to the evaluation of BDD variable ordering algorithms has yielded a number of conclusive results. The methodology relies on the equivalence classes of functionally perturbed circuits that maintain logic invariance, or are within (1, 2, ...)-minterms of the original reference circuit function, also maintaining entropy-invariance. For some of the current variable ordering algorithms and tools, the negative results include: statistically significant sensitivity to naming of variables; confirmation that a number of variable ordering algorithms are statistically equivalent to a random variable order assignment; and observation of a statistically anomalous variable ordering behavior of a well known benchmark circuit isomorphic class when analyzed under single and multiple outputs. On the positive side, the methodology supports a statistically significant merit evaluation of any newly introduced variable ordering algorithm, including the one briefly introduced in this paper.
         
        
            Keywords : 
VLSI; binary decision diagrams; design of experiments; equivalence classes; logic CAD; BDD; CAD; benchmark circuit isomorphic class; binary decision diagrams; design of experiments; entropy-invariance; equivalence classes; functionally perturbed circuits; logic invariance; random variable order assignment; reference circuit function; variable ordering; Algorithm design and analysis; Binary decision diagrams; Circuits; Collaboration; Design automation; Design methodology; Packaging; Permission; US Department of Energy; Very large scale integration;
         
        
        
        
            Conference_Titel : 
Computer-Aided Design, 1998. ICCAD 98. Digest of Technical Papers. 1998 IEEE/ACM International Conference on
         
        
            Conference_Location : 
San Jose, CA, USA
         
        
            Print_ISBN : 
1-58113-008-2
         
        
        
            DOI : 
10.1109/ICCAD.1998.144337