Title :
An Embedded System for Borescope and Eddy Current Dual Nondestructive Testing Based on ARM Microcontroller
Author :
Wugang, Tian ; Mengchun, Pan ; Feilu, Luo ; Jianbin, Su ; Dixiang, Chen
Author_Institution :
Coll. of Mechatron. Eng. & Autom., Nat. Univ. of Defense Technol., Changsha
Abstract :
In this paper, based on ARM9 microcontroller S3C2440A and embedded operating system Windows CE, a new nondestructive system was established. The system uses borescope and eddy current testing dual techniques combined into a single probe, which takes advantage of borescope and eddy current testing. The system combines traditional nondestructive testing technology with some advanced technologies, such as digital signal processing, automatic testing and embedded system. The system has excellent characteristics of miniaturization, low power consumption, intelligence, etc. The hardware and software of the system are described. The system works successfully, the detection results are available. The system can meet the requirements of in situ nondestructive testing for equipments.
Keywords :
artificial intelligence; automatic testing; digital signal processing chips; eddy current testing; embedded systems; microcontrollers; ARM microcontroller; automatic testing; borescope; digital signal processing; eddy current dual nondestructive testing; eddy current testing dual techniques; embedded operating system Windows CE; embedded system; intelligence; low power consumption; miniaturization; Automatic testing; Digital signal processing; Eddy current testing; Eddy currents; Embedded system; Energy consumption; Microcontrollers; Nondestructive testing; Operating systems; Probes; ARM microcontroller; Embedded system; borescope; eddy current testing; embedded operating system; nondestructive testing (NDT);
Conference_Titel :
Embedded Software and Systems, 2008. ICESS '08. International Conference on
Conference_Location :
Sichuan
Print_ISBN :
978-0-7695-3287-5
DOI :
10.1109/ICESS.2008.53
