• DocumentCode
    2523380
  • Title

    Adding analog, EPROM and EEPROM modules to CMOS logic technology: how modular?

  • Author

    Paterson, J.

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1989
  • fDate
    3-6 Dec. 1989
  • Firstpage
    413
  • Lastpage
    416
  • Abstract
    The issue of modularity (design, process, manufacturing, reliability) in the addition of analog (resistor and capacitor), EPROM (electrically programmable ROM) (12.5-V isolation and cell), and EEPROM (electrically erasable programmable ROM) (18-V isolation, 18-V transistor and cell) modules to core CMOS technologies is discussed. Design modularity permits the design of complex circuits using standard cell logic libraries, process modularity simplifies the task of creating and executing the process flow, manufacturing modularity defines the incremental equipment requirements, and reliability modularity eliminates the need to requalify the core process. Three specific examples are described, including an 18-V EEPROM module for a 1.6- mu m CMOS core for an 8-b microcontroller with EPROM and EEPROM; a 5-V analog module for a 1.0- mu m CMOS core for a 10-b switched-capacitor, analog-to-digital converter (ADC); and a 10-V EEPROM module for a 0.8- mu m CMOS core for a EPROM programmable array logic device.<>
  • Keywords
    CMOS integrated circuits; EPROM; analogue-digital conversion; application specific integrated circuits; digital integrated circuits; integrated circuit technology; logic arrays; microcontrollers; modules; 0.8 micron; 1 micron; 1.6 micron; 10 bit; 12.5 V; 18 V; 5 V; 8 bit; CMOS logic technology; EEPROM modules; EPROM programmable array logic device; analog module; analog-to-digital converter; complex circuits; core process; design modularity; incremental equipment requirements; manufacturing modularity; microcontroller; process modularity; reliability modularity; standard cell logic libraries; switched-capacitor; CMOS logic circuits; CMOS technology; Capacitors; EPROM; Isolation technology; Manufacturing processes; Process design; Programmable logic arrays; Read only memory; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
  • Conference_Location
    Washington, DC, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-0817-4
  • Type

    conf

  • DOI
    10.1109/IEDM.1989.74310
  • Filename
    74310