Title :
The properties of electrical conduction and photoconduction in polyphenylene sulfide by uniaxial elongation
Author :
Lee, U.Y. ; Shin, T.S. ; Park, Y.G. ; Lim, K.J. ; Kang, S.H. ; Ryu, B.H.
Author_Institution :
Dept. of Electr. Eng., Chung-Buk Nat. Univ., Cheongju, South Korea
Abstract :
We have investigated how morphology and electrical properties in Polyphenylene sulfide (PPS) are changed by uniaxial elongation. XRD pattern shows that interplanar distance and crystallization are decreased by increasing elongation ratio. Electrical conduction mechanism of PPS is explained as Schottky emission from analysis of electrical current. The electrical current is decreased and the insulation resistivity is increased by increasing elongation ratio. The conductivity is changed remarkably above the glass transition temperature around 82°C. The band gap of PPS is evaluated as 3.9 ~4 eV from the results of photoconductivity. Increasement of elongation ratio gives us some about deep trap formation from photocurrent
Keywords :
electrical conductivity; elongation; energy gap; organic insulating materials; photoconductivity; polymers; PPS; Schottky emission; XRD; band gap; crystallization; deep trap; electrical conduction; elongation; glass transition; insulation; morphology; photoconduction; polyphenylene sulfide; resistivity; Conductivity; Crystallization; Dielectrics and electrical insulation; Electrical resistance measurement; Morphology; Pattern analysis; Photoconductivity; Polymers; Temperature; X-ray scattering;
Conference_Titel :
Conduction and Breakdown in Solid Dielectrics, 1998. ICSD '98. Proceedings of the 1998 IEEE 6th International Conference on
Conference_Location :
Vasteras
Print_ISBN :
0-7803-4237-2
DOI :
10.1109/ICSD.1998.709270
