• DocumentCode
    252382
  • Title

    Performance evaluation of FinFET pass-transistor full adders with BSIM-CMG model

  • Author

    Martin, Cecilia Garcia ; Oruklu, Erdal

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • fYear
    2014
  • fDate
    3-6 Aug. 2014
  • Firstpage
    917
  • Lastpage
    920
  • Abstract
    In this paper, multiple full adder circuits have been implemented using the FinFET device described by the BSIM-CMG model. A variety of adders have been selected to compare the impact of this technology and evaluate the performance advantages that can be achieved. Full adder designs tested in this work include 28 transistor mirror adder, 10 transistor complementary and level restoring carry logic adder and ultra-low power full adder (ULPFA) architectures which cover a broad spectrum of adder designs. Comprehensive simulation results demonstrate FinFET transistors´ advantage in key design metrics, including reduced dynamic power, leakage current and delay. Overall, PDP gains of up to 83% is observed when compared to conventional CMOS circuits. However, FinFET pass-transistor circuits without level restorers are shown to be more vulnerable to voltage degradation compared to CMOS counterparts.
  • Keywords
    CMOS logic circuits; MOSFET circuits; adders; integrated circuit modelling; logic design; performance evaluation; BSIM-CMG model; CMOS circuits; FinFET pass-transistor full adder circuit; ULPFA architectures; adder designs; leakage current; level restoring carry logic adder; multiple full adder circuits; performance evaluation; reduced dynamic power; transistor complementary logic adder; transistor mirror adder; ultra-low power full adder architectures; Adders; CMOS integrated circuits; Delays; FinFETs; Mathematical model; Performance evaluation; BSIM-CMG; FinFET; full adder; leakage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
  • Conference_Location
    College Station, TX
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4799-4134-6
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2014.6908565
  • Filename
    6908565