• DocumentCode
    2523863
  • Title

    Bit-Flip Aware Control-Flow Error Detection

  • Author

    Nazarian, Ghazaleh ; Rodrigues, Diego G. ; Moreira, Alvaro ; Carro, Luigi ; Gaydadjiev, Georgi N.

  • Author_Institution
    Math. & Comput. Sci., Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2015
  • fDate
    4-6 March 2015
  • Firstpage
    215
  • Lastpage
    221
  • Abstract
    Recent increase of transient fault rates has made processor reliability a major concern. Moreover performance improvements are required for many of today´s embedded systems. At the same time software implemented fault detection remains the only option for off-the-shelf processors. Software methods, however, introduce significant performance overheads due to the additional instructions required for the detection. A good observation is that often code segments not susceptible to faults are protected. In this paper we propose a technique for systematic analysis of the bit-flip effects on the program control-flow in order to identify only those locations susceptible to control-flow errors and hence minimize the number of fault detection assertions. We instrument the code with minimal overhead, while maintaining high fault coverage level. Our experiments show that using the result of our bit-flip analysis and limiting the code instrumentation to only the susceptible locations releases 28.9% (on average) of the memory while the level of fault coverage remains the same as with full instrumentation.
  • Keywords
    data flow analysis; embedded systems; fault diagnosis; program control structures; software fault tolerance; software performance evaluation; bit-flip aware control-flow error detection; bit-flip effects systematic analysis; code instrumentation limiting; fault detection assertion number minimization; high fault coverage level; off-the-shelf processors; performance improvements; performance overheads; processor reliability; program control-flow; transient fault rates; Circuit faults; Hardware; Instruments; Program processors; Runtime; Transient analysis; Compiler-aided optimization; Control-flow error detection; Fault-tolerant;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Parallel, Distributed and Network-Based Processing (PDP), 2015 23rd Euromicro International Conference on
  • Conference_Location
    Turku
  • ISSN
    1066-6192
  • Type

    conf

  • DOI
    10.1109/PDP.2015.114
  • Filename
    7092723