• DocumentCode
    252391
  • Title

    A CMOS active-pixel image sharpness sensor

  • Author

    Rayankula, Aditya ; Furth, Paul M.

  • Author_Institution
    Klipsch Sch. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
  • fYear
    2014
  • fDate
    3-6 Aug. 2014
  • Firstpage
    933
  • Lastpage
    936
  • Abstract
    The technique of maximizing image sharpness is a powerful means of adaptively correcting phase aberrations in wavefronts. Crucial to this correction is a sensor that provides an accurate real-time estimate of image sharpness. In this paper, we introduce a novel image sharpness sensor using CMOS active pixel technology that computes image sharpness at a sample rate of 7.8 kHz. The sharpness sensor contains a 40×40 pixel array and is fabricated in a 0.5-μm CMOS process through MOSIS. Power consumption is 12 mW. Each pixel is 24.5 × 24.5 μm2 with a fill factor of 20%. Experimental results obtained under open-loop static conditions show that the output value changes by 87.5% when the sensor is moved 1 cm away from the 50-cm focal point. This sensor finds potential applications in closed-loop adaptive optics systems.
  • Keywords
    CMOS image sensors; power consumption; CMOS active-pixel image sharpness sensor; MOSIS; fill factor; frequency 7.8 kHz; open-loop static conditions; phase aberrations; power 12 mW; power consumption; size 0.5 mum; wavefronts; Adaptive optics; CMOS integrated circuits; Laser beams; Lenses; Measurement; Threshold voltage; Transistors; CMOS image sensor; Image sharpness; active-pixel; adaptive optics; image quality metric; wavefront sensor;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (MWSCAS), 2014 IEEE 57th International Midwest Symposium on
  • Conference_Location
    College Station, TX
  • ISSN
    1548-3746
  • Print_ISBN
    978-1-4799-4134-6
  • Type

    conf

  • DOI
    10.1109/MWSCAS.2014.6908569
  • Filename
    6908569