Title :
Post-electronic irradiation measurements by PEA and FLIMM methods on dielectric films
Author :
Nguyen, T.X. ; Bouchareb, S. ; Griseri, V. ; Berquez, L.
Author_Institution :
LAPLACE (Lab. Plasma et Conversion d´´Energie), Univ. de Toulouse, Toulouse, France
Abstract :
Dielectric materials are frequently used in satellite´s structure and especially as thermal blanket which are protecting the electronic devices embarked. Their behavior in relation to an electronic irradiation due to space environment must be clearly defined in order to prevent electrostatic discharges. Such discharges can be very harmful for the equipment. To study these materials an irradiation chamber called `Matspace´ has been built in the laboratory. In this study, we will focus our work on the analysis of electron behavior post irradiation in PolyTetraFluoroEthylene films of various thicknesses as they are storing charges for long period of time and they are widely employed in space industry. Space charge distribution will be recorded by mean of two complementary techniques: the Pulsed Electro-Acoustic method and the Focused Laser Intensity Modulated Method.
Keywords :
artificial satellites; avionics; dielectric measurement; dielectric thin films; electron beam effects; electrostatic discharge; intensity modulation; optical modulation; pulsed electroacoustic methods; space charge; FLIMM methods; Matspace; PEA methods; dielectric films; dielectric materials; electron behavior post irradiation; electronic device protection; electrostatic discharges; focused laser intensity modulated method; irradiation chamber; polytetrafluoroethylene films; post-electronic irradiation measurements; pulsed electroacoustic method; satellite structure; space charge distribution; space environment; space industry; Charge measurement; Electric fields; Electrodes; Electron beams; Laser beams; Radiation effects; Space charge;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4577-0985-2
DOI :
10.1109/CEIDP.2011.6232780