Title :
Future BiCMOS technology for scaled supply voltage
Author :
Watanabe, A. ; Nagano, T. ; Shukuri, S. ; Ikeda, T.
Author_Institution :
Hitachi Ltd., Ibaraki, Japan
Abstract :
A BiCMOS technology for future scaled supply voltage, V/sub x/, is described. Delay time reduction by around 100 ps is achieved by introducing a proposed base electrode surround emitter transistor (BEST). Two types of gates, CBiCMOS and BiNMOS, provide shorter gate delays and higher drivabilities than the CMOS gate even with V/sub s/, of 3.3 V. It is concluded that the innovations in the bipolar transistor structure BEST and in the CBiCMOS and BiNMOS gate circuit configuration are highly promising in comparison to CMOS ULSIs for future high-speed and high-density ULSIs operating at scaled supply voltages.<>
Keywords :
BIMOS integrated circuits; VLSI; delays; integrated circuit technology; logic gates; 3.3 V; BiCMOS technology; BiNMOS gate circuit configuration; CBiCMOS; CMOS ULSIs; CMOS gate; base electrode surround emitter transistor; delay time reduction; higher drivabilities; scaled supply voltage; shorter gate delays; BiCMOS integrated circuits; CMOS technology; Capacitance; Delay effects; Electrodes; Electron emission; Laboratories; Power dissipation; Ultra large scale integration; Voltage;
Conference_Titel :
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1989.74314