DocumentCode :
2524175
Title :
Temperature control of a handler test interface
Author :
Pfahni, A.C. ; Lienhard, J.H. ; Slocum, Alexander H.
Author_Institution :
Kinetrix Inc., Bedford, NH, USA
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
114
Lastpage :
118
Abstract :
A very compact electrical test contactor assembly design for a handler is described that gives a means to better match the temperature of the contactors (-60 degC to 160 degC) and the devices under test (DUTs). The resulting design aims for tight temperature control (±1 degC) of DUTs while minimizing the electrical transmission path length (~2.5 cm). A high thermal conductivity plate uses direct current (DC), electric resistance heaters and liquid nitrogen (LN2 ) to control the contactor temperatures. Tests at 90 degC confirm expected hot-temperature performance
Keywords :
contactors; electronic equipment testing; heat transfer; temperature control; test equipment; -60 to 160 C; 2.5 cm; 90 C; electric resistance heaters; electrical test contactor; handler test interface; hot-temperature performance; liquid nitrogen; temperature control; thermal conductivity plate; Assembly; Contacts; Electric resistance; Electronic equipment testing; Heat transfer; Resistance heating; System testing; Temperature control; Thermal conductivity; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743144
Filename :
743144
Link To Document :
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