• DocumentCode
    2524175
  • Title

    Temperature control of a handler test interface

  • Author

    Pfahni, A.C. ; Lienhard, J.H. ; Slocum, Alexander H.

  • Author_Institution
    Kinetrix Inc., Bedford, NH, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    114
  • Lastpage
    118
  • Abstract
    A very compact electrical test contactor assembly design for a handler is described that gives a means to better match the temperature of the contactors (-60 degC to 160 degC) and the devices under test (DUTs). The resulting design aims for tight temperature control (±1 degC) of DUTs while minimizing the electrical transmission path length (~2.5 cm). A high thermal conductivity plate uses direct current (DC), electric resistance heaters and liquid nitrogen (LN2 ) to control the contactor temperatures. Tests at 90 degC confirm expected hot-temperature performance
  • Keywords
    contactors; electronic equipment testing; heat transfer; temperature control; test equipment; -60 to 160 C; 2.5 cm; 90 C; electric resistance heaters; electrical test contactor; handler test interface; hot-temperature performance; liquid nitrogen; temperature control; thermal conductivity plate; Assembly; Contacts; Electric resistance; Electronic equipment testing; Heat transfer; Resistance heating; System testing; Temperature control; Thermal conductivity; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743144
  • Filename
    743144
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2524175