Title :
A Novel Approach for Combining Micro and Macro Mobility in 6LoWPAN Enabled Networks
Author :
Köster, Volker ; Dorn, Dennis ; Lewandowski, Andreas ; Wietfeld, Christian
Author_Institution :
Commun. Networks Inst. (CNI), TU Dortmund Univ., Dortmund, Germany
Abstract :
Industrial applications of IEEE 802.15.4 networks require autonomous network reconfiguration and high mobility support. Therefore, dynamic meshing in case of node failures or changing environmental influences is needed as well as handover strategies when nodes change network domains. Recently a growing number of low rated, low power sensor nodes are deployed within Wireless Sensor Networks (WSN) to support e.g. data acquisition and transmission. Therefore, this work focuses on a mobility management to combine micro and macro mobility aspects in form of mobile ad hoc network (MANET) protocols and Mobile Internet Protocol Version 6 (MIPv6) without changing the original MIPv6 stack. In addition to that the application of 6LoWPAN is addressed to make efficient data transmission feasible within embedded devices by IPv6 header compression which increases resulting payloads significantly. Finally, our approach is validated within a real world industrial simulation environment by combining the protocol simulator OMNeT++ with a ray tracing tool.
Keywords :
IP networks; failure analysis; microcellular radio; mobile ad hoc networks; mobility management (mobile radio); personal area networks; protocols; telecommunication network reliability; wireless sensor networks; 6LoWPAN enabled networks; IEEE 802.15.4 networks; MANET; MIPv6; OMNeT++; autonomous network reconfiguration; handover strategy; macro mobility; micro mobility; mobile Internet protocol version 6; mobile ad hoc network; mobility management; node failure analysis; protocol simulator; ray tracing tool; wireless sensor networks; Mobile ad hoc networks; Mobile communication; Mobile computing; Routing; Routing protocols; Wireless sensor networks;
Conference_Titel :
Vehicular Technology Conference (VTC Fall), 2011 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4244-8328-0
DOI :
10.1109/VETECF.2011.6093126