Title :
Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs
Author :
Sachdev, Manoj ; Janssen, Peter ; Zieren, Victor
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
Abstract :
Transient current testing (IDDT) has been often cited as an alternative and/or supplement to IDDQ testing. In this article we investigate the potential of transient current testing in faulty, chip detection with silicon devices. The effectiveness of the I DDT test method is compared with IDDQ as well as with SA-based voltage testing. Photon emission microscopy is used to localize defects in several faulty, devices. Furthermore, the potential of IDDT testing for leaky deep sub-micron devices is investigated
Keywords :
CMOS digital integrated circuits; VLSI; electric current measurement; elemental semiconductors; integrated circuit testing; silicon; transients; IDDQ testing; SA-based voltage testing; Si; Si devices; deep sub-micron CMOS IC; defect detection; effectiveness; leaky deep sub-micron devices; photon emission microscopy; transient current testing; Circuit faults; Circuit testing; Current measurement; Logic testing; Silicon; Switches; Variable structure systems; Velocity measurement; Very large scale integration; Voltage;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743153
