Title :
A distributed BIST technique for diagnosis of MCM interconnections
Author :
Pendurkar, Rajesh ; Chatterjee, Abhijit ; Zorian, Yervant
Author_Institution :
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A general description of an enhanced scheme for designing completely self-testable MCMs is given. It allows performance testing and diagnosis of MCM interconnections for dynamic effects. This scheme is based on embedding of cascadable test pattern generators and reconfigurable signature analyzers into the design of MCM dies. A theory of partitioning of linear registers is applied to devise a two phase distributed diagnosis strategy The design of a novel MISR reconfiguration scheme that enables high diagnosis resolution, is presented. Simulation results obtained confirm the effectiveness of our BIST technique
Keywords :
automatic testing; built-in self test; design for testability; digital simulation; integrated circuit interconnections; logic partitioning; logic testing; multichip modules; shift registers; MCM interconnections; MISR reconfiguration; cascadable test pattern generators; distributed BIST; distributed diagnosis; dynamic effects; embedding; fault diagnosis; linear registers; partitioning; performance testing; reconfigurable signature analyzers; self-testable MCM; simulation; two phase distributed diagnosis; Assembly; Automatic testing; Built-in self-test; Costs; Delay effects; Fault detection; Fault diagnosis; Packaging; Pattern analysis; Propagation delay;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743154
